Scanning Electron Microscope (Tabletop)

JEOL JCM-7000

Condition: excellent (used), Testing system for measuring tensile and compressive forces up to 100 kN Manufacturer: Zwick Type: 7045.370.1a Materials testing machine Tensile and compressive forces up to 100 kN PC Software: testXpert testing software Documentation: Basic program for tensile and compression testing Zimt command interpreter Instruction manual Cards & Modules: Zwick ZPS 7095.1 Rev.: d Power supply unit Zwick ZPU 7095.2 Rev.: j Central processing unit Fpjdsqtrkdopfx Ah Uop Zwick ZAST 7096.4 Rev.: f Drive control unit Sieb & Meyer AC-Servo 26.39.2 AC-Servo module Dimensions: Height: 3200 mm Width: 1120 mm Depth: 620 mm Weight: 1140 kg Modernization of the Frank machine 81120 1995 Cost: 113,000 DM Modernization of the universal testing machine with digital measurement and control electronics Additional slots for 3 connection cards Remote control for extended control of the testing machine during setup and test execution Measuring amplifier (TF) for force or analog length change Connector for voltage measurements (e.g., single strain gauge with preamplifier), without calibration Connector for strain gauge transducers for force or displacement measurement, without calibration Control unit with IEEE 488 bus card ZIMT program for calibrating the force transducers in conjunction with the DK 38 MGT 32 S 71 (0 ... 10 V output) and the Keithly 182 digital multimeter Program sequence: 10 calibration steps under load or unload Files are available in the ASCII file Drive unit for the Frank 81120 AC Motor Resolver with motor plate Find more new and used items in our shop! International shipping costs on request!

Condition: good (used), Year of construction: 2003, machine/vehicle number: 4N1028, overall weight: 300 kg, total length: 1,400 mm, total height: 1,520 mm, total width: 780 mm, type of input current: AC, input voltage: 230 V, Equipment: type plate available, SPECTRO LAVMC05A SPECTROLAB spark spectrometer, metal analysis device Input: 230 VAC / 50 Hz Fpjdpsvytaljfx Ah Ujp Power: 2500 VA

Condition: ready for operation (used), Two identical Keyence measuring devices are available. Image sensor: 1inch 6.6 megapixel CMOS, lens: Double telecentric lens. Wide field diameter/length: 100mm/200mm, High precision diameter/length: 25mm/125mm. Repeatability: Without stage movement: +/-1µm(wide field), +/-0.5µm(high precision), with stage movement: +/-2µm(wide field), +/-1.5µm(high precision). Measuring accuracy (+/-2 sigma): Without binding: +/-5µm(wide field), +/-2µm(high precision), with binding: +/- (7+0.02L)µm(wide field), +/-(4 +0.02L)µm(high precision). Fedpfxothmffo Ah Uopp

Condition: excellent (used), Zeiss Type: EVO 50 Fpjdpfx Asvxubhsh Uep The instruments in the EVO product family combine powerful scanning electron microscopy with an intuitive operating concept that is equally well suited to experienced users and newcomers. Thanks to its extensive options, EVO can be precisely tailored to your requirements, regardless of whether you work in the field of life sciences or materials science or in routine industrial quality control and error analysis. Scanning electron microscope EVO 50, EDS from Oxford Ultim Max 100 SDD detector 09 / 2019 Dimensions: DxLxH 930 x 1930 x 1600 mm 100 mm² sensor size / 130,000cps Weight: approx. 750 kg Condition: used (Changes and errors in the technical data, information is reserved!) Please inquire about transport options before purchasing. We will be happy to answer any further questions you may have over the phone.

Condition: reconditioned (used), Year of construction: 2025, operating hours: 20 h, functionality: fully functional, measuring range X-axis: 200 mm, measuring range Y-axis: 200 mm, measuring range Z-axis: 200 mm, workpiece weight (max.): 15 kg, warranty duration: 12 months, type of input current: AC, travel distance X-axis: 200 mm, travel distance Y-axis: 200 mm, travel distance Z-axis: 200 mm, input voltage: 230 V, Equipment: documentation/manual, lighting, type plate available, 3D coordinate measuring machine Mahr MS2VT used multi-sensor CMM with motor zoom and active vibration damping Factory overhauled premium multisensor measuring center with guarantee and warranty rebuilt 2022. Incl. latest SW update, 18 months free SW update service, free lifetime SW hotline and user support. Delivery with factory service or forwarding agency, worldwide. Fjdjdz Er Ropfx Ah Ujpp Online, optionally on-site demos with customer parts, application technology advice from accredited Profitech measurement laboratories during project planning. Complete service: – Delivery, construction, commissioning, accuracy acceptance according to standard, certification and extensive acceptance documentation. Individual education and training programs can also be booked as online courses. Rent-hire-purchase or financing possible directly via Profitech and without a financial institution. Measuring device individually configurable to customer needs • Measuring range single sensor: 200x200x200mm • Dimensions: 900x750x950mm Bcym337udm • Weight: about 170kg • Accuracy: E2 = 2.4 + L/150 [?m] • Refurbished 2024 • incl. USB camera with fixed focal length • incl. LED ring light • including calibration standard • incl. 2-monitor operation • incl. new Windows 10 • incl. Opticheck3D 5.0 ​​evaluation software (12 months free SW update) Manufacturer's icon image (sister device)

Condition: good (used), Year of construction: 2006, CNC tube bending machine by Dynobend Model: CB 60 Year of manufacture: 2006 Tube length: 4500 mm Fjdpfewx I Iasx Ah Uepp Including various tools: Round 40 R 60 Round 28 Round 32

Year of construction: 2012, condition: good (used), Machine has 5600 total spindle hours Fsdpfxswvqh Ds Ah Ujpp Datron D 5 Dental - milling machine, year of manufacture 2012, 5-axis simultaneous machining, PC control – Beckhoff, automation / 8 blanks, milling spindle 1.8 kW, spindle speed up to 50,000 rpm, tool holder HSK C 25, 15-position tool changer, rotary and tilting axis, A axis +/- 25°, B axis +/- 45°

Condition: excellent (used), Here we offer you a Jeol scanning electron microscope. Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope with newly developed electron optics and intuitive, graphical user interface (GUI) under Microsoft WindowsXP Professional. Magnification range: 5 X - 300,000 X Accelerating voltage 0.3 - 30 kV Tungsten hairpin cathode (LaB6 cathode optional) large fully motorized sample stage with eucentric tilting, incl. Graphic navigation on the sample holder Easy sample navigation by click center zoom Image field controlled navigation via 2 navigators Relative coordinate navigation Saving and restarting of specimen positions Adjustable blldschnittswelses movement of the specimen stage Field correction during rotation via computer-controlled eucentric eccentric rotation Image field correction during tilting via computer-controlled controlled eucentric tilting Calculation of the possible tilt angle on the basis of the sample geometry automatic focus tracking when moving the specimen in specimen in Z-axis Intelligent limit switches for the motorized axes Travel of specimen stage: x=125mm Y=100mm z= 5 to 80 mm (continuous) T= -10°C to+ 90°C R= 360°C (endless) Secondary electron detector for high vacuum operation Novel, superconical objective lens guarantees high image resolution image resolution even at large tilt angles Guaranteed resolution In SE image: 3 nm at 30 kV and 15 nm at 1 kV Simultaneous live image display of multiple detectors Easy sample navigation through Cllck Center Zoom Powerful image measurement functions Movie function for recording dynamic processes Versatile sample chamber with numerous free flanges, e.g. for EDX, WDX, EBSD, cathodoluminescence etc. Low-maintenance and low-wear, quiet pump system consisting of backing pump, vibration-free high-likelihood diffusion pump and electromagnetic valve control Extensive fault protection against faulty operation and failure of external media Ergonomic, height-adjustable system table SEM starter kit consisting of 2 specimen holders, tool set and 6 spare cathodes Additional equipment 2x ΜΡ-43100 (TMP) Fpsdpfemn Rcqox Ah Uep Turbomolecular pump instead of the standard diffusion pump When a turbomolecular pump is used, cooling water is no longer operation of the SEM, cooling water is no longer required. Further equipment: PC for control of the SEM incl. TFT monitor ΟΧ200 Bruker Quantax 200 EDX system EXTENDED Nitrogen-free, energy dispersive X-ray analysis system. incl: SDD detector with 127 eV or better energy resolution. Detection of all elements from boron upwards Vibration free, maintenance free. Peltier cooled (nitrogen free) Pulse processor TFT monitor Spectra measurement and elemental diflcultation Fully automatic, quantitative, standard-free elemental analysis Image acquisition Superfast qualitative LIneScan Superfast qualitative element mapping Data management and archiving system Report generation and results output Data communication Installation and training HyperMap Multipoint analysis Bruker xFlash Detector (SDD) with Signal Processing Unit SVE III Type: Jeol JSM-6490 Scope of delivery: (See photos) Condition: used / used (Changes and errors in the technical data, specifications are reserved!) Further questions we can answer for you on the phone.

Condition: refurbished (used), Measuring Range X/Y/Z = 900 x 1200 x 850mm Accuracy 4,0 + 4,5L/1000 (origin setup, now better after Retrofit) Completely refurbished 2018 with new Pantec Eagle Pro Controller Probesystem is Renishaw PH10MQ and SP25M Software Inspect3D Inca Premium actual version Computer is a HP z240 Fpjdpfodpak Rox Ah Usp Option : Laserscanner (e.g. Kreon) Probe changer

Year of construction: 2000, condition: used, - Condition: used - Location: Bremen - Other: - Manufacturer: Fryma - Type: VME-12/C - Year of manufacture: 2000 - Material product space: 1.4435 (V4A) - Product chamber: - Capacity: 22 liters - Max. Overpressure: 2,5 bar - Max. Temperature: 100° C/li> Fedpfx Aehzxbajh Uepp - Double jacket - Capacity: 3,3 liters - Max. Overpressure: 4 bar - Technical documentation